Multi-band microwave sensor based on Hilbert's fractal for dielectric solid material characterization
Por:
Silva, CPD, Araujo, JAI, Coutinho, MS, de Oliveira, MRT, Llamas-Garro, I, de Melo, MT
Publicada:
3 may 2021
Ahead of Print:
1 dic 2020
Resumen:
A planar sensor designed using the fourth Hilbert fractal curve iteration for solid material characterization at multiple frequencies is reported in this paper. The fractal curve is self-similar with space-filling properties. The Hilbert fractal geometry is used to form a compact resonator, with a multiband frequency response where miniaturization is achieved since a large transmission line length is effectively confined in a limited area. The sensor provides five resonances in the frequency range from 0 to 5 GHz. The resonant frequencies are 0.56, 1.68, 2.72, 3.69 and 4.72 GHz, all used to measure the real permittivity of known samples with a sensitivity of 7, 20, 27, 43 and 50 MHz/permittivity, respectively. The sensor is used to measure dielectric samples with 20 x 20 mm(2) areas with several thicknesses. Simulations and measurements demonstrate that the Hilbert fractal geometry can be used to design a multiband planar sensor for solid dielectric material characterization.
Filiaciones:
Silva, CPD:
Univ Fed Pernambuco, Dept Eletron & Syst, UFPE, Recife, PE, Brazil
CTTC CERCA, Ctr Tecnol Telecomunicac Catalunya, Barcelona, Spain
Araujo, JAI:
Univ Fed Pernambuco, Dept Eletron & Syst, UFPE, Recife, PE, Brazil
Coutinho, MS:
Univ Fed Pernambuco, Dept Eletron & Syst, UFPE, Recife, PE, Brazil
de Oliveira, MRT:
Univ Fed Pernambuco, Dept Eletron & Syst, UFPE, Recife, PE, Brazil
Llamas-Garro, I:
CTTC CERCA, Ctr Tecnol Telecomunicac Catalunya, Barcelona, Spain
de Melo, MT:
Univ Fed Pernambuco, Dept Eletron & Syst, UFPE, Recife, PE, Brazil
Green Submitted, All Open Access; Green Open Access
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