Multi-band microwave sensor based on Hilbert’s fractal for dielectric solid material characterization
Por:
Silva, C. P. do N., Araujo, J. A. I., Coutinho, M. S., de Oliveira, M. R. T., Llamas-Garro, I., de Melo, M. T.
Publicada:
1 ene 2021
Ahead of Print:
1 dic 2020
Resumen:
A planar sensor designed using the fourth Hilbert fractal curve iteration for solid material characterization at multiple frequencies is reported in this paper. The fractal curve is self-similar with space-filling properties. The Hilbert fractal geometry is used to form a compact resonator, with a multiband frequency response where miniaturization is achieved since a large transmission line length is effectively confined in a limited area. The sensor provides five resonances in the frequency range from 0 to 5 GHz. The resonant frequencies are 0.56, 1.68, 2.72, 3.69 and 4.72 GHz, all used to measure the real permittivity of known samples with a sensitivity of 7, 20, 27, 43 and 50 MHz/permittivity, respectively. The sensor is used to measure dielectric samples with 20 × 20 mm2 areas with several thicknesses. Simulations and measurements demonstrate that the Hilbert fractal geometry can be used to design a multiband planar sensor for solid dielectric material characterization. © 2020 Informa UK Limited, trading as Taylor & Francis Group.
Filiaciones:
Silva, C. P. do N.:
Univ Fed Pernambuco, Dept Eletron & Syst, UFPE, Recife, PE, Brazil
CTTC CERCA, Ctr Tecnol Telecomunicac Catalunya, Barcelona, Spain
Araujo, J. A. I.:
Univ Fed Pernambuco, Dept Eletron & Syst, UFPE, Recife, PE, Brazil
Coutinho, M. S.:
Univ Fed Pernambuco, Dept Eletron & Syst, UFPE, Recife, PE, Brazil
de Oliveira, M. R. T.:
Univ Fed Pernambuco, Dept Eletron & Syst, UFPE, Recife, PE, Brazil
Llamas-Garro, I.:
CTTC CERCA, Ctr Tecnol Telecomunicac Catalunya, Barcelona, Spain
de Melo, M. T.:
Univ Fed Pernambuco, Dept Eletron & Syst, UFPE, Recife, PE, Brazil
Green Submitted, All Open Access; Green Open Access
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